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1 Ergebnisse
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Precision of single-engage micro Hall effect measurements:
, In:
2014 International Workshop on Junction Technology (IWJT)
,
Henrichsen, Henrik H.
;
Hansen, Ole
;
Kjaer, Daniel
... - p. 1-4 , 2014
Link:
https://doi.org/10.1109/IWJT.2014.6842029
RT T1
2014 International Workshop on Junction Technology (IWJT)
: T1
Precision of single-engage micro Hall effect measurements
UL https://suche.suub.uni-bremen.de/peid=ieee-6842029&Exemplar=1&LAN=DE A1 Henrichsen, Henrik H. A1 Hansen, Ole A1 Kjaer, Daniel A1 Nielsen, Peter F. A1 Wang, Fei A1 Petersen, Dirch H. YR 2014 K1 Probes K1 Electrical resistance measurement K1 Semiconductor device measurement K1 Signal to noise ratio K1 Resistance K1 Standards K1 Hall effect SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IWJT.2014.6842029 DO https://doi.org/10.1109/IWJT.2014.6842029 SF ELIB - SuUB Bremen
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