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Mechanism of off-leakage current in InGaZnO thin-film trans..:

, In: 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK),
Wakimura, Go ; Yamauchi, Yoshimitsu ; Matsuoka, Toshimasa. - p. 1-2 , 2014
Link: https://doi.org/10.1109/IMFEDK.2014.6867062