I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Experiences with a two terminal-pair digital impedance brid..:
, In:
29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
,
Callegaro, Luca
;
D'Elia, Vincenzo
;
Kampik, Marian
... - p. 222-223 , 2014
Link:
https://doi.org/10.1109/CPEM.2014.6898339
RT T1 <cTitle>29th Conference on Precision Electromagnetic Measurements (CPEM 2014)</cTitle>: T1 <Title>Experiences with a two terminal-pair digital impedance bridge</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-6898339&Exemplar=1&LAN=DE A1 Callegaro, Luca A1 D'Elia, Vincenzo A1 Kampik, Marian A1 Kim, Dan Bee A1 Ortolano, Massimo A1 Pourdanesh, Faranak A1 Mai Tran, Ngoc Thanh YR 2014 SN 2160-0171 SN 0589-1485 K1 Bridge circuits K1 Impedance K1 Standards K1 Impedance measurement K1 Admittance K1 Stability criteria K1 Metrology K1 impedance K1 admittance K1 measurement standards K1 precision measurements K1 bridge circuits SP 222 OP 223 LK http://dx.doi.org/https://doi.org/10.1109/CPEM.2014.6898339 DO https://doi.org/10.1109/CPEM.2014.6898339 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
