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1 Ergebnisse
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Quantitative local current-voltage analysis with different ..:
, In:
2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
,
Pletzer, Tobias M.
;
van Molken, Justus I.
;
Rissland, Sven
... - p. 3473-3478 , 2014
Link:
https://doi.org/10.1109/PVSC.2014.6925680
RT T1 <cTitle>2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)</cTitle>: T1 <Title>Quantitative local current-voltage analysis with different spatially-resolved camera based techniques of silicon solar cells with cracks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-6925680&Exemplar=1&LAN=DE A1 Pletzer, Tobias M. A1 van Molken, Justus I. A1 Rissland, Sven A1 Hallam, Brett A1 Cornagliotti, Emanuele A1 John, Joachim A1 Breitenstein, Otwin A1 Knoch, Joachim YR 2014 SN 0160-8371 K1 Voltage measurement K1 Photovoltaic cells K1 Current measurement K1 Radiative recombination K1 Mechanical variables measurement K1 Semiconductor device measurement K1 Thyristors K1 cracks K1 local current-voltage parameters K1 silicon solar cells K1 thermography K1 electro K1 photoluminescence SP 3473 OP 3478 LK http://dx.doi.org/https://doi.org/10.1109/PVSC.2014.6925680 DO https://doi.org/10.1109/PVSC.2014.6925680 SF ELIB - SuUB Bremen
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