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1 Ergebnisse
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Analysis of TID failure modes in SRAM-based FPGA based on g..:
, In:
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Ding, Li-Li
;
Lei-Chen
;
Sun, Hua-Bo
... - p. 1-7 , 2013
Link:
https://doi.org/10.1109/RADECS.2013.6937434
RT T1
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Analysis of TID failure modes in SRAM-based FPGA based on gamma-ray and synchrotron X-ray irradiation
UL https://suche.suub.uni-bremen.de/peid=ieee-6937434&Exemplar=1&LAN=DE A1 Ding, Li-Li A1 Lei-Chen A1 Sun, Hua-Bo A1 Fan, Ru-Yu A1 Guo, Hong-Xia A1 Chen, Wei A1 Yao, Zhi-Bin A1 Yan, Yi-Hua A1 Chen, Dong-Liang A1 Paccagnella, Alessandro A1 Gerardin, Simone A1 Bartagin, Marta YR 2013 K1 Radiation effects K1 Synchrotrons K1 Field programmable gate arrays K1 Gamma-rays K1 Circuit simulation K1 Degradation K1 Photonics K1 SRAM-based FPGA K1 total ionizing dose effect K1 synchrotron X-ray irradiation K1 failure modes SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/RADECS.2013.6937434 DO https://doi.org/10.1109/RADECS.2013.6937434 SF ELIB - SuUB Bremen
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