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Gate-drain capacitance behaviour of the DMOS power transist..:

, In: PESC 98 Record. 29th Annual IEEE Power Electronics Specialists Conference (Cat. No.98CH36196),
Deml, C. ; Hoffmann, K. - p. 1716,1717,1718,1719 , 1998
Link: https://doi.org/10.1109/PESC.1998.703412