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Evaluation of variability and RTN in scaled RRAM:

, In: 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW),
Veksler, Dmitry ; Bersuker, G. ; Butcher, B.... - p. 52-52 , 2014
Link: https://doi.org/10.1109/IIRW.2014.7049509