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1 Ergebnisse
1
High current diode and SCR reliability considerations:
, In:
1975 IEEE Power Electronics Specialists Conference
,
Comstock, W. R.
;
Locher, R. E.
- p. 224-233 , 1975
Link:
https://doi.org/10.1109/PESC.1975.7085586
RT T1 <cTitle>1975 IEEE Power Electronics Specialists Conference</cTitle>: T1 <Title>High current diode and SCR reliability considerations</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7085586&Exemplar=1&LAN=DE A1 Comstock, W. R. A1 Locher, R. E. YR 1975 SN 0275-9306 K1 Thyristors K1 Temperature measurement K1 Reliability K1 Logic gates K1 Junctions K1 Resistance K1 Semiconductor diodes SP 224 OP 233 LK http://dx.doi.org/https://doi.org/10.1109/PESC.1975.7085586 DO https://doi.org/10.1109/PESC.1975.7085586 SF ELIB - SuUB Bremen
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