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1 Ergebnisse
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A novel structure of MOSFET array to measure ioff-ion with ..:
, In:
Proceedings of the 2015 International Conference on Microelectronic Test Structures
,
Suzuki, Tsuyoshi
;
Fukuzaki, Yuzo
;
Verkest, Diederik
... - p. 9-13 , 2015
Link:
https://doi.org/10.1109/ICMTS.2015.7106095
RT T1
Proceedings of the 2015 International Conference on Microelectronic Test Structures
: T1
A novel structure of MOSFET array to measure ioff-ion with high accuracy and high density
UL https://suche.suub.uni-bremen.de/peid=ieee-7106095&Exemplar=1&LAN=DE A1 Suzuki, Tsuyoshi A1 Fukuzaki, Yuzo A1 Verkest, Diederik A1 Ohnuma, Hidetoshi A1 Anchlia, Ankur A1 Cherman, Vladimir A1 Oishi, Hidetoshi A1 Mori, Shigetaka A1 Ryckaert, Julien A1 Ogawa, Kazuhisa A1 Van der Plas, Geert A1 Beyne, Eric YR 2015 SN 1071-9032 SN 2158-1029 K1 MOSFET K1 MOSFET circuits K1 CMOS integrated circuits K1 Switching circuits K1 Pollution measurement K1 Arrays K1 Monitoring SP 9 OP 13 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS.2015.7106095 DO https://doi.org/10.1109/ICMTS.2015.7106095 SF ELIB - SuUB Bremen
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