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A novel structure of MOSFET array to measure ioff-ion with ..:

, In: Proceedings of the 2015 International Conference on Microelectronic Test Structures,
Suzuki, Tsuyoshi ; Fukuzaki, Yuzo ; Verkest, Diederik... - p. 9-13 , 2015
Link: https://doi.org/10.1109/ICMTS.2015.7106095