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Compact modeling solution of layout dependent effect for Fi..:

, In: Proceedings of the 2015 International Conference on Microelectronic Test Structures,
Chen, David C. ; Lin, Guan Shyan ; Lee, Tien Hua... - p. 110-115 , 2015
Link: https://doi.org/10.1109/ICMTS.2015.7106119