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1 Ergebnisse
1
Analysis of pull-in voltage shift for RF MEMS ohmic switche:
, In:
2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)
,
Huang, Qinwen
;
Li, Xiangguang
;
Le, Lu
.. - p. 106-109 , 2014
Link:
https://doi.org/10.1109/ICRMS.2014.7107147
RT T1
2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)
: T1
Analysis of pull-in voltage shift for RF MEMS ohmic switches
UL https://suche.suub.uni-bremen.de/peid=ieee-7107147&Exemplar=1&LAN=DE A1 Huang, Qinwen A1 Li, Xiangguang A1 Le, Lu A1 He, Chunhua A1 Wang, Yunhui YR 2014 K1 Radio frequency K1 Electrodes K1 Micromechanical devices K1 Fatigue K1 Electric breakdown K1 Voltage measurement K1 Lifetime estimation K1 pull-in voltage K1 RF MEMS K1 Young's modulus K1 mechanical fatigue SP 106 OP 109 LK http://dx.doi.org/https://doi.org/10.1109/ICRMS.2014.7107147 DO https://doi.org/10.1109/ICRMS.2014.7107147 SF ELIB - SuUB Bremen
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