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1 Ergebnisse
1
MBIST and statistical hypothesis test for time dependent di..:
, In:
2015 IEEE 33rd VLSI Test Symposium (VTS)
,
Kim, Woongrae
;
Chen, Chang-Chih
;
Cha, Soonyoung
. - p. 1-6 , 2015
Link:
https://doi.org/10.1109/VTS.2015.7116289
RT T1
2015 IEEE 33rd VLSI Test Symposium (VTS)
: T1
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array
UL https://suche.suub.uni-bremen.de/peid=ieee-7116289&Exemplar=1&LAN=DE A1 Kim, Woongrae A1 Chen, Chang-Chih A1 Cha, Soonyoung A1 Milor, Linda YR 2015 SN 1093-0167 SN 2375-1053 K1 Built-in self-test K1 SRAM cells K1 Circuit faults K1 Logic gates K1 Transistors K1 Arrays K1 Built-In Self-Test (BIST) K1 statistical hypothesis test K1 dielectric breakdown K1 wearout mechanisms K1 BTDDB K1 GOBD K1 wearout distribution SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/VTS.2015.7116289 DO https://doi.org/10.1109/VTS.2015.7116289 SF ELIB - SuUB Bremen
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