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State of art of current and future technologies in current ..:
, In:
2015 IEEE First International Conference on DC Microgrids (ICDCM)
,
Ouaida, Remy
;
Berthou, Maxime
;
Tournier, Dominique
. - p. 175-180 , 2015
Link:
https://doi.org/10.1109/ICDCM.2015.7152034
RT T1 <cTitle>2015 IEEE First International Conference on DC Microgrids (ICDCM)</cTitle>: T1 <Title>State of art of current and future technologies in current limiting devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7152034&Exemplar=1&LAN=DE A1 Ouaida, Remy A1 Berthou, Maxime A1 Tournier, Dominique A1 Depalma, Jean-Francois YR 2015 K1 Fuses K1 Circuit breakers K1 Limiting K1 Silicon carbide K1 Fault currents K1 Switches K1 Circuit faults K1 Power Supply K1 Current Limitation K1 Protection Device K1 Hybride Circuit Breaker SP 175 OP 180 LK http://dx.doi.org/https://doi.org/10.1109/ICDCM.2015.7152034 DO https://doi.org/10.1109/ICDCM.2015.7152034 SF ELIB - SuUB Bremen
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