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1 Ergebnisse
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Fracture mechanism analysis for stealth dicing applied in w..:
, In:
2015 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)
,
Chuang, Wan-Chun
;
Tu, Wei-Hsiang
;
Lin, Guan-shian
.. - p. 1-4 , 2015
Link:
https://doi.org/10.1109/DTIP.2015.7161040
RT T1
2015 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)
: T1
Fracture mechanism analysis for stealth dicing applied in wafer expansion
UL https://suche.suub.uni-bremen.de/peid=ieee-7161040&Exemplar=1&LAN=DE A1 Chuang, Wan-Chun A1 Tu, Wei-Hsiang A1 Lin, Guan-shian A1 Hwang, Jeong-Yuan A1 Lee, Chin-Sung YR 2015 K1 Semiconductor device modeling K1 Strain K1 Silicon K1 Market research K1 Laser beams K1 Material properties K1 Force K1 fracture mechanism K1 stealth laser K1 wafer dicing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/DTIP.2015.7161040 DO https://doi.org/10.1109/DTIP.2015.7161040 SF ELIB - SuUB Bremen
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