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1 Ergebnisse
1
Near-field injection at die level:
, In:
2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)
,
Boyer, A.
;
Vrignon, B.
;
Shepherd, J.
- p. 478-481 , 2015
Link:
https://doi.org/10.1109/APEMC.2015.7175281
RT T1
2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)
: T1
Near-field injection at die level
UL https://suche.suub.uni-bremen.de/peid=ieee-7175281&Exemplar=1&LAN=DE A1 Boyer, A. A1 Vrignon, B. A1 Shepherd, J. YR 2015 SN 2162-7673 K1 Probes K1 Couplings K1 Integrated circuit modeling K1 Voltage measurement K1 Wires K1 Magnetic fields SP 478 OP 481 LK http://dx.doi.org/https://doi.org/10.1109/APEMC.2015.7175281 DO https://doi.org/10.1109/APEMC.2015.7175281 SF ELIB - SuUB Bremen
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