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Fast and reliable charge-trap non-volatile memories using l..:

, In: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits,
Huang, Wen-Hsien ; Yang, Chih-Chao ; Hsieh, Tung-Ying... - p. 392-394 , 2015
Link: https://doi.org/10.1109/IPFA.2015.7224424