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1 Ergebnisse
1
More Than Moore - Wafer Scale Integration of Dissimilar Mat..:
, In:
2015 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
,
Kazior, Thomas E.
;
LaRoche, Jeffery R.
;
Ip, Kelly
... - p. 1-1 , 2015
Link:
https://doi.org/10.1109/CSICS.2015.7314517
RT T1
2015 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
: T1
More Than Moore - Wafer Scale Integration of Dissimilar Materials on a Si Platform
UL https://suche.suub.uni-bremen.de/peid=ieee-7314517&Exemplar=1&LAN=DE A1 Kazior, Thomas E. A1 LaRoche, Jeffery R. A1 Ip, Kelly A1 Kennedy, Theodore A1 Knickerbocker, John A1 Tsang, Cornelia A1 Soirez, Lovelace YR 2015 SN 1550-8781 SN 2374-8443 K1 Silicon K1 Gallium nitride K1 CMOS integrated circuits K1 Performance evaluation K1 Radio frequency K1 Integrated circuit interconnections K1 III-V semiconductor materials SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/CSICS.2015.7314517 DO https://doi.org/10.1109/CSICS.2015.7314517 SF ELIB - SuUB Bremen
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