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1 Ergebnisse
1
Physical characterization of different dielectrics for thin..:
, In:
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics
,
Danto, Y.
;
Barriere, A.S.
;
Girma, T.
... - p. 400-405 , 1983
Link:
https://doi.org/10.1109/ICSD.1983.7411546
RT T1
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics
: T1
Physical characterization of different dielectrics for thin film capacitors in gaAs MMIC's
UL https://suche.suub.uni-bremen.de/peid=ieee-7411546&Exemplar=1&LAN=DE A1 Danto, Y. A1 Barriere, A.S. A1 Girma, T. A1 Pichon, J. A1 Jay, P.R. A1 Rumelhard, C. YR 1983 K1 Current measurement K1 Dielectric measurement K1 Erbium K1 Atmospheric measurements K1 Particle measurements K1 Thickness measurement K1 Dielectrics SP 400 OP 405 LK http://dx.doi.org/https://doi.org/10.1109/ICSD.1983.7411546 DO https://doi.org/10.1109/ICSD.1983.7411546 SF ELIB - SuUB Bremen
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