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Study of SiO2 thickness effect on insertion loss of CMOS 60..:

, In: 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS),
Mahmoud, Nessim ; Barakat, Adel ; Abd El-Hameed, Anwer S.... - p. 237-239 , 2015
Link: https://doi.org/10.1109/ICECS.2015.7440292