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1 Ergebnisse
1
Numerical analysis on RHEED patterns based on gray level: A..:
, In:
2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)
,
Shi, Xiao Liang
;
Fan, Feng
;
Guo, Yan Qun
... - p. 458-459 , 2015
Link:
https://doi.org/10.1109/ASEMD.2015.7453659
RT T1 <cTitle>2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)</cTitle>: T1 <Title>Numerical analysis on RHEED patterns based on gray level: A case study of IBAD-MgO film</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7453659&Exemplar=1&LAN=DE A1 Shi, Xiao Liang A1 Fan, Feng A1 Guo, Yan Qun A1 Bai, Chuan Yi A1 Lu, Yu Ming A1 Liu, Zhi Yong A1 Cai, Chuan Bing A1 Fan, Feng A1 Guo, Yan Qun A1 Bai, Chuan Yi A1 Lu, Yu Ming A1 Liu, Zhi Yong A1 Cai, Chuan Bing YR 2015 K1 Films K1 Ion beams K1 Diffraction K1 Numerical analysis K1 X-ray diffraction K1 Brightness K1 Monitoring K1 RHEED pattern K1 analysis method K1 biaxially textured K1 IBAD-MgO SP 458 OP 459 LK http://dx.doi.org/https://doi.org/10.1109/ASEMD.2015.7453659 DO https://doi.org/10.1109/ASEMD.2015.7453659 SF ELIB - SuUB Bremen
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