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Estimation of measurement uncertainty for devices with extr..:

, In: 2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD),
Xie, Xuan ; Li, Xi Feng ; Bi, Dong Jie... - p. 484-485 , 2015
Link: https://doi.org/10.1109/ASEMD.2015.7453670