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Study and reduction of variability in 28 nm FDSOI technolog:

, In: 2015 International Workshop on CMOS Variability (VARI),
Jacquemod, Gilles ; Wei, Zhaopeng ; Modad, Jad... - p. 19-22 , 2015
Link: https://doi.org/10.1109/VARI.2015.7456557