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Session on the measurement of dielectric properties at elev..:
, In:
1965 Sixth Electrical Insulation Conference
,
Wechsler, Kenneth H.
- p. 250-252 , 1965
Link:
https://doi.org/10.1109/EIC.1965.7461240
RT T1 <cTitle>1965 Sixth Electrical Insulation Conference</cTitle>: T1 <Title>Session on the measurement of dielectric properties at elevated temperatures, introduction</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7461240&Exemplar=1&LAN=DE A1 Wechsler, Kenneth H. YR 1965 K1 Temperature measurement K1 Temperature K1 Dielectric measurement K1 Immune system K1 Dielectric breakdown K1 Dielectric constant SP 250 OP 252 LK http://dx.doi.org/https://doi.org/10.1109/EIC.1965.7461240 DO https://doi.org/10.1109/EIC.1965.7461240 SF ELIB - SuUB Bremen
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