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Ellipsometry and its use in high voltage applications:

, In: 1978 IEEE International Conference on Electrical Insulation,
Zaghloul, A.-R. M. ; Radwan, R. M. ; Elshazly-Zaghloul, M. - p. 103-105 , 1978
Link: https://doi.org/10.1109/EIC.1978.7463605