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1 Ergebnisse
1
An accurate scalable model for 700V LDMOS:
, In:
2016 China Semiconductor Technology International Conference (CSTIC)
,
Li, Pingliang
;
Wang, Zhengnan
;
Zhang, Sunny
- p. 1-3 , 2016
Link:
https://doi.org/10.1109/CSTIC.2016.7463906
RT T1 <cTitle>2016 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>An accurate scalable model for 700V LDMOS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7463906&Exemplar=1&LAN=DE A1 Li, Pingliang A1 Wang, Zhengnan A1 Zhang, Sunny YR 2016 K1 Capacitance K1 Solid modeling K1 Logic gates K1 Electrical resistance measurement K1 Data models K1 Immune system K1 Capacitance measurement SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC.2016.7463906 DO https://doi.org/10.1109/CSTIC.2016.7463906 SF ELIB - SuUB Bremen
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