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1 Ergebnisse
1
Structure imperfection and dielectric properties of single-..:
, In:
2016 IEEE 36th International Conference on Electronics and Nanotechnology (ELNANO)
,
Pashchenko, A. V.
;
Liedienov, N. A.
;
Burchovetski, V. V.
... - p. 107-109 , 2016
Link:
https://doi.org/10.1109/ELNANO.2016.7493023
RT T1 <cTitle>2016 IEEE 36th International Conference on Electronics and Nanotechnology (ELNANO)</cTitle>: T1 <Title>Structure imperfection and dielectric properties of single-phase multifferoic Bi1-xLaxFeO3-δ</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7493023&Exemplar=1&LAN=DE A1 Pashchenko, A. V. A1 Liedienov, N. A. A1 Burchovetski, V. V. A1 Prokopenko, V. K. A1 Sycheva, V. Ya. A1 Pismenova, N. E. A1 Levchenko, G. G. A1 Tatarchuk, D. D. A1 Didenko, Y. V. YR 2016 K1 Permittivity K1 Periodic structures K1 Ceramics K1 Scanning electron microscopy K1 Dielectric losses K1 Microstructure K1 ceramics K1 rapid liquid sintering method K1 defect structure K1 microstructure K1 dielectric permittivity K1 dielectric loss tangent SP 107 OP 109 LK http://dx.doi.org/https://doi.org/10.1109/ELNANO.2016.7493023 DO https://doi.org/10.1109/ELNANO.2016.7493023 SF ELIB - SuUB Bremen
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