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Generation of a comprehensive tester measurement systems an..:

, In: 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW),
Calip, Eric D. ; Aranas, Christian Argon G. ; Ramos, Mark D. - p. 1-5 , 2016
Link: https://doi.org/10.1109/IMS3TW.2016.7524236