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Development and Reliability Evaluation of Large Scale Thin ..:

, In: 2016 IEEE 66th Electronic Components and Technology Conference (ECTC),
Bum, Lee Jong ; Choong, Chong Ser ; Yuen, Au Keng. - p. 2089-2094 , 2016
Link: https://doi.org/10.1109/ECTC.2016.316