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1
A Thermal Damage Model for Bipolar Semiconductors:
, In:
1977 IEEE International Symposium on Electromagnetic Compatibility
,
Hjellen, G. A.
;
Lange, T. J.
- p. 1-4 , 1977
Link:
https://doi.org/10.1109/ISEMC.1977.7567239
RT T1 <cTitle>1977 IEEE International Symposium on Electromagnetic Compatibility</cTitle>: T1 <Title>A Thermal Damage Model for Bipolar Semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7567239&Exemplar=1&LAN=DE A1 Hjellen, G. A. A1 Lange, T. J. YR 1977 K1 Solid modeling K1 Semiconductor device modeling K1 Junctions K1 Lightning K1 Transient analysis K1 Data models K1 Electric breakdown SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ISEMC.1977.7567239 DO https://doi.org/10.1109/ISEMC.1977.7567239 SF ELIB - SuUB Bremen
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