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Hot-carrier analysis on nMOS Si FinFETs with solid source d..:

, In: 2016 IEEE International Reliability Physics Symposium (IRPS),
Chasin, Adrian ; Franco, Jacopo ; Ritzenthaler, Romain... - p. 4B-4-1-4B-4-6 , 2016
Link: https://doi.org/10.1109/IRPS.2016.7574535