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Thermally stimulated decay of negatively charged Teflon - F..:
, In:
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1980
,
Seggern, Heinz V.
- p. 345-352 , 1980
Link:
https://doi.org/10.1109/EIDP.1980.7683864
RT T1 <cTitle>Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1980</cTitle>: T1 <Title>Thermally stimulated decay of negatively charged Teflon - FEP</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7683864&Exemplar=1&LAN=DE A1 Seggern, Heinz V. YR 1980 K1 Electron traps K1 Corona K1 Temperature measurement K1 Electron beams K1 Current measurement K1 Filling SP 345 OP 352 LK http://dx.doi.org/https://doi.org/10.1109/EIDP.1980.7683864 DO https://doi.org/10.1109/EIDP.1980.7683864 SF ELIB - SuUB Bremen
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