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1
Pulse breakdown in silicon oxide films:
, In:
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1967
,
Klein, N.
;
Burstein, E.
- p. 108-112 , 1967
Link:
https://doi.org/10.1109/CEIDP.1967.7736329
RT T1 <cTitle>Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1967</cTitle>: T1 <Title>Pulse breakdown in silicon oxide films</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7736329&Exemplar=1&LAN=DE A1 Klein, N. A1 Burstein, E. YR 1967 K1 Electric breakdown K1 Breakdown voltage K1 Capacitors K1 Heating K1 Substrates K1 Silicon SP 108 OP 112 LK http://dx.doi.org/https://doi.org/10.1109/CEIDP.1967.7736329 DO https://doi.org/10.1109/CEIDP.1967.7736329 SF ELIB - SuUB Bremen
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