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1
Impact ionization experiments on compound semiconductors:
, In:
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987
,
Robbins, V. M.
;
Stillman, G. E.
- p. 202-208 , 1987
Link:
https://doi.org/10.1109/CEIDP.1987.7736557
RT T1
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987
: T1
Impact ionization experiments on compound semiconductors
UL https://suche.suub.uni-bremen.de/peid=ieee-7736557&Exemplar=1&LAN=DE A1 Robbins, V. M. A1 Stillman, G. E. YR 1987 K1 Electric fields K1 Impact ionization K1 Charge carrier processes K1 Photoconductivity K1 III-V semiconductor materials K1 Current measurement SP 202 OP 208 LK http://dx.doi.org/https://doi.org/10.1109/CEIDP.1987.7736557 DO https://doi.org/10.1109/CEIDP.1987.7736557 SF ELIB - SuUB Bremen
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