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1 Ergebnisse
1
Material Classification Using Raw Time-of-Flight Measuremen..:
, In:
2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
,
Su, Shuochen
;
Heide, Felix
;
Swanson, Robin
... - p. 3503-3511 , 2016
Link:
https://doi.org/10.1109/CVPR.2016.381
RT T1
2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
: T1
Material Classification Using Raw Time-of-Flight Measurements
UL https://suche.suub.uni-bremen.de/peid=ieee-7780750&Exemplar=1&LAN=DE A1 Su, Shuochen A1 Heide, Felix A1 Swanson, Robin A1 Klein, Jonathan A1 Callenberg, Clara A1 Hullin, Matthias A1 Heidrich, Wolfgang YR 2016 SN 1063-6919 K1 Correlation K1 Image sensors K1 Mathematical model K1 Scattering K1 Frequency measurement K1 Sensors K1 Cameras SP 3503 OP 3511 LK http://dx.doi.org/https://doi.org/10.1109/CVPR.2016.381 DO https://doi.org/10.1109/CVPR.2016.381 SF ELIB - SuUB Bremen
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