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1 Ergebnisse
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Extended state observer based fault detection and location ..:
, In:
IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society
,
Xing Hu
;
Jianzhong Zhang
;
Shuai Xu
. - p. 2166-2171 , 2016
Link:
https://doi.org/10.1109/IECON.2016.7793575
RT T1 <cTitle>IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Extended state observer based fault detection and location method for modular multilevel converters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7793575&Exemplar=1&LAN=DE A1 Xing Hu A1 Jianzhong Zhang A1 Shuai Xu A1 Jun Hang YR 2016 K1 Circuit faults K1 Fault diagnosis K1 Observers K1 Capacitors K1 Switches K1 Mathematical model K1 Silicon K1 modular multilevel converter K1 fault diagnosis K1 extended state observer K1 modified switching models SP 2166 OP 2171 LK http://dx.doi.org/https://doi.org/10.1109/IECON.2016.7793575 DO https://doi.org/10.1109/IECON.2016.7793575 SF ELIB - SuUB Bremen
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