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1 Ergebnisse
1
Real-life vs. standard driving cycles and implications on E..:
, In:
IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society
,
Degrenne, N.
;
Mollov, S.
- p. 2177-2182 , 2016
Link:
https://doi.org/10.1109/IECON.2016.7793633
RT T1 <cTitle>IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Real-life vs. standard driving cycles and implications on EV power electronic reliability</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7793633&Exemplar=1&LAN=DE A1 Degrenne, N. A1 Mollov, S. YR 2016 K1 Reliability K1 Insulated gate bipolar transistors K1 Standards K1 Histograms K1 Acceleration K1 Mathematical model K1 Computational modeling K1 power semiconductor K1 automotive power converter K1 design for reliability K1 drive cycle K1 mission profile SP 2177 OP 2182 LK http://dx.doi.org/https://doi.org/10.1109/IECON.2016.7793633 DO https://doi.org/10.1109/IECON.2016.7793633 SF ELIB - SuUB Bremen
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