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1 Ergebnisse
1
An Optical/Electrical Test System for 100-Gb/s Optical Inte..:
, In:
2016 IEEE 25th Asian Test Symposium (ATS)
,
Mizushima, Takeshi
;
Shirahata, Kazuki
;
Fujibe, Tasuku
... - p. 130-130 , 2016
Link:
https://doi.org/10.1109/ATS.2016.51
RT T1
2016 IEEE 25th Asian Test Symposium (ATS)
: T1
An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production
UL https://suche.suub.uni-bremen.de/peid=ieee-7796099&Exemplar=1&LAN=DE A1 Mizushima, Takeshi A1 Shirahata, Kazuki A1 Fujibe, Tasuku A1 Matsumura, Hidenobu A1 Watanabe, Daisuke A1 Mineo, Hiroyuki A1 Masuda, Shin YR 2016 SN 2377-5386 K1 Optical devices K1 Optical fibers K1 Optical variables measurement K1 High-speed optical techniques K1 Optical interconnections K1 Testing K1 Optical interconnection devices K1 high volume manufacturing K1 device interface K1 optical fiber K1 optical device socket SP 130 OP 130 LK http://dx.doi.org/https://doi.org/10.1109/ATS.2016.51 DO https://doi.org/10.1109/ATS.2016.51 SF ELIB - SuUB Bremen
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