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Autonomous Testing for 3D-ICs with IEEE Std. 1687:

, In: 2016 IEEE 25th Asian Test Symposium (ATS),
Ye, Jin-Cun ; Kochte, Michael A. ; Lee, Kuen-Jong. - p. 215-220 , 2016
Link: https://doi.org/10.1109/ATS.2016.56