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Calibration of a contact probe for micro-nano CMM:
, In:
2016 10th International Conference on Sensing Technology (ICST)
,
Huang, Qiangxian
;
Mei, Jian
;
Guo, Qiang
... - p. 1-5 , 2016
Link:
https://doi.org/10.1109/ICSensT.2016.7796305
RT T1
2016 10th International Conference on Sensing Technology (ICST)
: T1
Calibration of a contact probe for micro-nano CMM
UL https://suche.suub.uni-bremen.de/peid=ieee-7796305&Exemplar=1&LAN=DE A1 Huang, Qiangxian A1 Mei, Jian A1 Guo, Qiang A1 Li, Ruijun A1 Gong, Ermin A1 Chen, Lijuan YR 2016 SN 2156-8073 K1 Probes K1 Calibration K1 Optical interferometry K1 Measurement by laser beam K1 Three-dimensional displays K1 Optical variables measurement K1 Mirrors K1 Micro/nano CMM K1 Contact probe K1 Taylor expansion SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICSensT.2016.7796305 DO https://doi.org/10.1109/ICSensT.2016.7796305 SF ELIB - SuUB Bremen
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