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1 Ergebnisse
1
Five years of pulsed current testing for HVDC switchgear:
, In:
2016 IEEE International Conference on High Voltage Engineering and Application (ICHVE)
,
Ritter, A.
;
Bort, L.S.J.
;
Franek, C.M.
- p. 1-4 , 2016
Link:
https://doi.org/10.1109/ICHVE.2016.7800658
RT T1
2016 IEEE International Conference on High Voltage Engineering and Application (ICHVE)
: T1
Five years of pulsed current testing for HVDC switchgear
UL https://suche.suub.uni-bremen.de/peid=ieee-7800658&Exemplar=1&LAN=DE A1 Ritter, A. A1 Bort, L.S.J. A1 Franek, C.M. YR 2016 K1 Capacitors K1 Insulated gate bipolar transistors K1 Current measurement K1 Voltage measurement K1 Switches K1 Testing K1 Semiconductor diodes K1 pulsed current K1 current source K1 testing K1 HVDC switchgear SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICHVE.2016.7800658 DO https://doi.org/10.1109/ICHVE.2016.7800658 SF ELIB - SuUB Bremen
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