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The construction of degradation trend using the "random-eff..:
, In:
2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)
,
Chimitova, Ekaterina V.
;
Chetvertakova, Evgeniya S.
;
Faddeenkov, Andrey V.
- p. 378-380 , 2016
Link:
https://doi.org/10.1109/APEIE.2016.7806493
RT T1 <cTitle>2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)</cTitle>: T1 <Title>The construction of degradation trend using the "random-effect" models</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7806493&Exemplar=1&LAN=DE A1 Chimitova, Ekaterina V. A1 Chetvertakova, Evgeniya S. A1 Faddeenkov, Andrey V. YR 2016 K1 Degradation K1 Market research K1 Computational modeling K1 Analytical models K1 Indexes K1 Gaussian distribution K1 Reliability K1 degradation process K1 Wiener degradation model K1 semi-parametric model K1 random effect K1 maximum-likelihood estimate SP 378 OP 380 LK http://dx.doi.org/https://doi.org/10.1109/APEIE.2016.7806493 DO https://doi.org/10.1109/APEIE.2016.7806493 SF ELIB - SuUB Bremen
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