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Performance Analysis of Wavy FinFET and Optimization for Le..:
, In:
2016 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS)
,
Anju, C.
;
Kuruvilla, Nisha
;
Khan, T.E. Ayoob
. - p. 83-88 , 2016
Link:
https://doi.org/10.1109/iNIS.2016.030
RT T1
2016 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS)
: T1
Performance Analysis of Wavy FinFET and Optimization for Leakage Reduction
UL https://suche.suub.uni-bremen.de/peid=ieee-7829528&Exemplar=1&LAN=DE A1 Anju, C. A1 Kuruvilla, Nisha A1 Khan, T.E. Ayoob A1 Hameed, T.A. Shahul YR 2016 K1 FinFETs K1 Doping K1 Logic gates K1 Ions K1 Threshold voltage K1 Substrates K1 High-k dielectric materials K1 FinFET K1 Ultrathin Body K1 Wavy K1 SOI K1 Leakage SP 83 OP 88 LK http://dx.doi.org/https://doi.org/10.1109/iNIS.2016.030 DO https://doi.org/10.1109/iNIS.2016.030 SF ELIB - SuUB Bremen
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