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1 Ergebnisse
1
Passivation quality and electrical characteristics for boro..:
, In:
2017 China Semiconductor Technology International Conference (CSTIC)
,
Tseng, Ching-Lin
;
Hsieh, Yu-Lin
;
Lee, Chien-Chieh
.. - p. 1-3 , 2017
Link:
https://doi.org/10.1109/CSTIC.2017.7919798
RT T1 <cTitle>2017 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>Passivation quality and electrical characteristics for boron doped hydrogenated amorphous silicon film</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7919798&Exemplar=1&LAN=DE A1 Tseng, Ching-Lin A1 Hsieh, Yu-Lin A1 Lee, Chien-Chieh A1 Yu, Hsiang-Chih A1 Li, Tomi T. YR 2017 K1 Boron K1 Charge carrier lifetime K1 Electrodes K1 Conductivity K1 Doping SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC.2017.7919798 DO https://doi.org/10.1109/CSTIC.2017.7919798 SF ELIB - SuUB Bremen
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