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1 Ergebnisse
1
Effect of annealing on the characteristics of Ti/Al ohmic c..:
, In:
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM)
,
Tang, Yi-Dan
;
Shen, Hua-Jun
;
Zhang, Xu-Fang
... - p. 1-1 , 2016
Link:
https://doi.org/10.4028/www.scientific.net/MSF.897.395
RT T1 <cTitle>2016 European Conference on Silicon Carbide & Related Materials (ECSCRM)</cTitle>: T1 <Title>Effect of annealing on the characteristics of Ti/Al ohmic contacts to p-Type 4H-SiC</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7921292&Exemplar=1&LAN=DE A1 Tang, Yi-Dan A1 Shen, Hua-Jun A1 Zhang, Xu-Fang A1 Fei, Guo A1 Yun, Bai A1 Peng, Zhao-Yang A1 Liu, Xin-Yu YR 2016 SN 1662-9752 K1 Ohmic contacts K1 Silicon carbide K1 Annealing K1 X-ray scattering K1 Temperature measurement K1 Microstructure K1 Metals K1 Ti/Al ohmic contacts K1 SCRs K1 XRD K1 gradual Ti3SiC2 ISL SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/MSF.897.395 DO https://doi.org/10.4028/www.scientific.net/MSF.897.395 SF ELIB - SuUB Bremen
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