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1 Ergebnisse
1
Failure prediction using low stability phenomenon of digita..:
, In:
2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Nakao, Hiroshi
;
Yonezawa, Yu
;
Nakashima, Yoshiyasu
. - p. 2323-2328 , 2017
Link:
https://doi.org/10.1109/APEC.2017.7931024
RT T1 <cTitle>2017 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Failure prediction using low stability phenomenon of digitally controlled SMPS by electrolytic capacitor ESR degradation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7931024&Exemplar=1&LAN=DE A1 Nakao, Hiroshi A1 Yonezawa, Yu A1 Nakashima, Yoshiyasu A1 Kurokawa, Fujio YR 2017 SN 2470-6647 K1 Switched mode power supplies K1 Capacitors K1 Degradation K1 Circuit stability K1 Stability analysis K1 Pulse width modulation K1 digitally controlled switching mode power supply K1 Equivalent Serial Resistance K1 Electrolytic Capacitor K1 low stability phenomenon K1 failure prediction SP 2323 OP 2328 LK http://dx.doi.org/https://doi.org/10.1109/APEC.2017.7931024 DO https://doi.org/10.1109/APEC.2017.7931024 SF ELIB - SuUB Bremen
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