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1 Ergebnisse
1
System-level ESD noise induced by secondary discharges at v..:
, In:
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
,
Park, Junsik
;
Kim, Jingook
;
Lee, Jongsung
.. - p. 70-72 , 2017
Link:
https://doi.org/10.1109/APEMC.2017.7975427
RT T1 <cTitle>2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)</cTitle>: T1 <Title>System-level ESD noise induced by secondary discharges at voltage suppressor devices in a mobile product</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7975427&Exemplar=1&LAN=DE A1 Park, Junsik A1 Kim, Jingook A1 Lee, Jongsung A1 Jo, Cheolgu A1 Seol, Byongsu YR 2017 K1 Voltage measurement K1 Electrostatic discharges K1 Discharges (electric) K1 Metals K1 Noise measurement K1 Mobile communication K1 Transmission line measurements K1 Electrostatic discharge (ESD) K1 secondary discharge K1 voltage suppressor device K1 power-ground noise K1 snapback K1 voltage clamping SP 70 OP 72 LK http://dx.doi.org/https://doi.org/10.1109/APEMC.2017.7975427 DO https://doi.org/10.1109/APEMC.2017.7975427 SF ELIB - SuUB Bremen
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