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Experimental-theoretical thermal and electrical analyses of..:
, In:
2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
,
d'Egmont, Philippe R.
;
Naveira-Cotta, Carolina P.
;
Dias, Robson F. S.
... - p. 339-346 , 2017
Link:
https://doi.org/10.1109/ITHERM.2017.7992491
RT T1
2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
: T1
Experimental-theoretical thermal and electrical analyses of insulated gate bipolar transistors (IGBT) power module
UL https://suche.suub.uni-bremen.de/peid=ieee-7992491&Exemplar=1&LAN=DE A1 d'Egmont, Philippe R. A1 Naveira-Cotta, Carolina P. A1 Dias, Robson F. S. A1 Tostado, Christopher P. A1 Duda, Fernando P. A1 Chen, Kelvin YR 2017 K1 Insulated gate bipolar transistors K1 Silicon K1 Conferences K1 Heating systems K1 Copper K1 Aluminum oxide K1 thermal management K1 electronic devices K1 IGBT K1 switching devices K1 conjugated problem K1 numerical simulation validation K1 infrared thermography SP 339 OP 346 LK http://dx.doi.org/https://doi.org/10.1109/ITHERM.2017.7992491 DO https://doi.org/10.1109/ITHERM.2017.7992491 SF ELIB - SuUB Bremen
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