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Investigation of the reverse voltage stress on the fluorine..:

, In: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT),
Zhang, Ya-Song ; Cao, Yan-Rong ; Li, Peng... - p. 1035-1037 , 2016
Link: https://doi.org/10.1109/ICSICT.2016.7998642