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Analysis and simulation of the effects of parametric drift ..:

, In: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT),
Lv, Qiu-Ye ; Xie, Lei ; Peng, Yong... - p. 1297-1299 , 2016
Link: https://doi.org/10.1109/ICSICT.2016.7998719