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1 Ergebnisse
1
Experimental study of single event upset and single event l..:
, In:
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
,
Wang, Linfei
;
Han, Zhengsheng
;
Liu, Hainan
... - p. 1506-1508 , 2016
Link:
https://doi.org/10.1109/ICSICT.2016.7998784
RT T1 <cTitle>2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)</cTitle>: T1 <Title>Experimental study of single event upset and single event latch-up in SOI SRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-7998784&Exemplar=1&LAN=DE A1 Wang, Linfei A1 Han, Zhengsheng A1 Liu, Hainan A1 Chen, Likun A1 Zhou, Yuelin A1 Zhang, Hongyuan A1 Gao, Jiantou A1 Zhao, Fazhan A1 Luo, Jiajun A1 Yu, Fang YR 2016 K1 Ions K1 Random access memory K1 Indexes K1 Chirp K1 Silicon On Insulator (SOI) K1 SRAM K1 SEU K1 SEL SP 1506 OP 1508 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2016.7998784 DO https://doi.org/10.1109/ICSICT.2016.7998784 SF ELIB - SuUB Bremen
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